Test-Driven Development For Embedded C++ Programmers: Paper

Test-Driven Development For Embedded C++ Programmers: Paper

James W. Grenning

Language: English

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C++ CppUTest DLP Debug Later Programming Embedded Embedded C++ TDD Test-Driven-Development

Publisher: Wingman Software

Published: Jul 22, 2003

BibTeX: techreport
Worte: 8638
Seiten: 20
FRE: 79
GFI: 12
FKGL: 7

Description:

Test-Driven Development For Embedded C++ Programmers

Test-Driven Development For Embedded C++ Programmers was written for the Embedded Systems Conference, and presented there several times since 2002. The slides are from Bob Martin and James W. Grenning co-presented and demonstrated TDD to a crowd of embedded engineers in San Jose, Ca.